Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

Delay testing is used to verify that a circuit meets its timing specifications. This chapter introduces delay testing of digital logic in synchronous circuits and then focuses on delay tests that ...

Semiconductor companies have come to rely on delay testing to attain high defect coverage of manufactured digital integrated circuits (ICs). Delay testing uses transition delay (TD) patterns created ...